A one-day workshop on “Empowering the Next Generation of Edge AI Innovators” and “Semiconductor Device Characterisation & Test Validation” was held on 24th September 2025 at Nagaland University’s Kohima campus. It was jointly organised by the Departments of IT, CSE, and ECE, School of Engineering & Technology.
The first session was conducted by Satish Mohanram, Senior Director and GM, SiMa.ai (India). He guided participants on building and deploying Edge AI applications using SiMa.ai’s DevKit and Palette Edgematic software. Live demonstrations of Palette Software, Palette Edgematic, and Modalix in action were conducted. He also discussed future opportunities in AI, including research projects for students, collaboration opportunities for professors, and innovation pathways for startups and industry.
The second session was conducted by Dr. Boopesh Mahela, Application Expert from Tektronix. He briefed participants on test and measurement instruments from Tektronix and Keithley and explained Semiconductor Device Characterisation and Test Validation. He highlighted the process of bringing fabrication to the lab, where device-level to wafer-level testing solutions are made accessible using high-precision testing instruments. The session concluded with live demonstrations and hands-on activities.
The workshop was attended by scholars, faculty, and students of NU-SET.
